Optical characterization of point defects on internal quantum efficiency in AlGaN quantum wells grown on face-to-face-annealed sputtered AlN templates

نویسندگان

چکیده

The correlation between the internal quantum efficiency (IQE) and effective diffusion length estimated by cathodoluminescence intensity line profile near dark spots, including effect of non-radiative recombination due to point defects, was experimentally clarified for AlGaN multiple wells (MQWs) on face-to-face annealed (FFA) sputter-deposited AlN templates with different IQEs similar dislocation densities. IQEs, which were determined temperature- excitation-power-dependent photoluminescence measurements, independent spot densities increased increasing (Leff) from analysis. These results suggested that MQW/FFA samples governed defect density. fitting relationship IQE Leff Cmax explained experimental qualitatively.

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ژورنال

عنوان ژورنال: AIP Advances

سال: 2023

ISSN: ['2158-3226']

DOI: https://doi.org/10.1063/5.0145131